光耦合器在高、低剂量率下的位移损伤和总电离剂量

2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI:10.1109/REDW56037.2022.9921554

Z. Yang, D. Hiemstra, S. Shi, C. Jin, Z. -. Li, L. Chen

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引用次数: 0

摘要

采用105mev质子和${}^{60}\ mathm {Co}$辐照，研究了光耦合器的位移损伤剂量和总电离剂量性能。结果表明，位移损伤剂量比电离剂量的降解作用更为显著。表明电离剂量降解不依赖于剂量率。讨论了光耦合器在空间辐射环境下的性能。

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Displacement Damage and Total Ionizing Dose at High and Low Dose Rate Performance of an Optocoupler

Displacement damage dose and total ionizing dose performance of an optocoupler were studied by using 105 MeV protons and ${}^{60}\mathrm{Co}$ irradiation. The results show degradation due to displacement damage dose is more significant than ionizing dose. Ionizing dose degradation is shown to not depend on dose rate. The optocoupler's performance in the space radiation environment is discussed.

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来源期刊

2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)

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