电流可测试的高频CMOS运算放大器

Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372) Pub Date : 1998-09-13 DOI:10.1109/ASIC.1998.722810

J. Velasco-Medina, S. Mir, M. Nicolaidis

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引用次数: 4

摘要

提出了一种基于电流注入的高频运算放大器测试新方法。基于电流的测试刺激允许检测一些故障，这些故障在使用传统的基于电压的测试刺激时难以检测或无法检测。此外，由于在电流注入的整个频带中都可以观察到错误行为，因此测试刺激的选择更简单。本文设计了一个可测试电流的运算放大器的实例，并且电流注入所需的小测试电路对电路性能的影响可以忽略不计。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Current-testable high-frequency CMOS operational amplifiers

A new test approach for high-frequency operational amplifiers based on current injection is presented in this paper. Current-based test stimuli allow detection of some faults which are difficult to detect or are untestable when conventional voltage-based test stimuli are used. In addition, the selection of test stimuli is simpler since faulty behaviours are observable in the whole frequency band with current injection. An example of a current-testable operational amplifier has been designed, and the small test circuitry required for current injection has a negligible impact on circuit performance.

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来源期刊

Proceedings Eleventh Annual IEEE International ASIC Conference (Cat. No.98TH8372)

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