Matityahu Karelits, Gilad Hirshfeld, Yaakov Mandelbaum, A. Chelly, A. Karsenty
{"title":"用于NSOM的亚波长孔径纳米硅截锥形光电探测器","authors":"Matityahu Karelits, Gilad Hirshfeld, Yaakov Mandelbaum, A. Chelly, A. Karsenty","doi":"10.1109/OMN.2017.8051465","DOIUrl":null,"url":null,"abstract":"Silicon-based photodetector sharing subwavelength aperture and shaped as a truncated conical-probe, has been electrically and optically simulated. Designed for NSOM, it may collect near-field surface information with clear advantage of a resolution inaccessible by conventional optical microscopy. Results present a promising device for several wavelengths.","PeriodicalId":411243,"journal":{"name":"2017 International Conference on Optical MEMS and Nanophotonics (OMN)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Nanoscale silicon truncated conical photodetector at subwavelength aperture for NSOM applications\",\"authors\":\"Matityahu Karelits, Gilad Hirshfeld, Yaakov Mandelbaum, A. Chelly, A. Karsenty\",\"doi\":\"10.1109/OMN.2017.8051465\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Silicon-based photodetector sharing subwavelength aperture and shaped as a truncated conical-probe, has been electrically and optically simulated. Designed for NSOM, it may collect near-field surface information with clear advantage of a resolution inaccessible by conventional optical microscopy. Results present a promising device for several wavelengths.\",\"PeriodicalId\":411243,\"journal\":{\"name\":\"2017 International Conference on Optical MEMS and Nanophotonics (OMN)\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 International Conference on Optical MEMS and Nanophotonics (OMN)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/OMN.2017.8051465\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 International Conference on Optical MEMS and Nanophotonics (OMN)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/OMN.2017.8051465","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Nanoscale silicon truncated conical photodetector at subwavelength aperture for NSOM applications
Silicon-based photodetector sharing subwavelength aperture and shaped as a truncated conical-probe, has been electrically and optically simulated. Designed for NSOM, it may collect near-field surface information with clear advantage of a resolution inaccessible by conventional optical microscopy. Results present a promising device for several wavelengths.