用于电源管理应用的0.18μm技术的通用30V模拟CMOS工艺

Yong-Keon Choi, I. Park, H. Lim, Mi-Young Kim, Chul-Jin Yoon, Nam-Joo Kim, K. Yoo, L. Hutter
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引用次数: 7

摘要

在0.18 μm技术节点上开发了一种具有成本效益和模块化的通用30V模拟CMOS工艺。为了减少热收支,在CMOS井形成后形成深度NWELL隔离。从7V到30V的漏极扩展(DE) CMOS在击穿电压和特定导通电阻之间表现出非常有竞争力的权衡性能。此外,采用纯栅氧化工艺可获得5V CMOS低1/f噪声。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A versatile 30V analog CMOS process in a 0.18μm technology for power management application
A versatile 30V analog CMOS process in a 0.18 μm technology node has been developed by using cost-effective and modular fashion. To reduce the thermal budget deep NWELL isolation is formed after CMOS well formation. The drain-extended (DE) CMOS from 7V to 30V shows very competitive trade-off performance between the breakdown voltage and the specific on-resistance. In addition, low 1/f noise of 5V CMOS can be obtained by pure gate oxide process.
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