{"title":"IBIS模型的SSN问题","authors":"A. Varma, Michael B. Steer, Paul D. Franzon","doi":"10.1109/EPEP.2004.1407554","DOIUrl":null,"url":null,"abstract":"A CMOS driver circuit is simulated in HSPICE and compared with an equivalent circuit created with IBIS (input/output buffer information specification) models of the same drivers. The IBIS models are created using the s2ibis tool from North Carolina State University. IBIS model of the driver is also compared against model created using spline functions with finite time difference approximation modeling techniques. The three modeling techniques are analyzed for accuracy in modeling simultaneous switching noise in drivers.","PeriodicalId":143349,"journal":{"name":"Electrical Performance of Electronic Packaging - 2004","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-10-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"SSN issues with IBIS models\",\"authors\":\"A. Varma, Michael B. Steer, Paul D. Franzon\",\"doi\":\"10.1109/EPEP.2004.1407554\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A CMOS driver circuit is simulated in HSPICE and compared with an equivalent circuit created with IBIS (input/output buffer information specification) models of the same drivers. The IBIS models are created using the s2ibis tool from North Carolina State University. IBIS model of the driver is also compared against model created using spline functions with finite time difference approximation modeling techniques. The three modeling techniques are analyzed for accuracy in modeling simultaneous switching noise in drivers.\",\"PeriodicalId\":143349,\"journal\":{\"name\":\"Electrical Performance of Electronic Packaging - 2004\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-10-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Performance of Electronic Packaging - 2004\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.2004.1407554\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Performance of Electronic Packaging - 2004","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2004.1407554","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A CMOS driver circuit is simulated in HSPICE and compared with an equivalent circuit created with IBIS (input/output buffer information specification) models of the same drivers. The IBIS models are created using the s2ibis tool from North Carolina State University. IBIS model of the driver is also compared against model created using spline functions with finite time difference approximation modeling techniques. The three modeling techniques are analyzed for accuracy in modeling simultaneous switching noise in drivers.
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