MUSCA SEP3为研究65nm直接电离质子扰动技术在空间、大气和地面的应用做出了贡献

2009 European Conference on Radiation and Its Effects on Components and Systems Pub Date : 2009-09-01 DOI:10.1109/RADECS.2009.5994577

G. Hubert, S. Duzellier, F. Bezerra, R. Ecoffet

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引用次数: 33

摘要

本文介绍了65纳米技术中质子直接电离引起的扰动，并评估了在空间、大气和地面环境中操作SER的后果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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MUSCA SEP3 contributions to investigate the direct ionization proton upset in 65nm technology for space, atmospheric and ground applications

This paper presents the investigation of upset induced by direct ionisation of proton in 65nm technology and evaluates the operational SER consequences in space, atmospheric and ground environments.

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2009 European Conference on Radiation and Its Effects on Components and Systems

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