低功耗扫描分区和扫描保持

Efi Arvaniti, Y. Tsiatouhas
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引用次数: 15

摘要

扫描测试动态功耗会在制造测试过程中引起被测电路(CUT)的可靠性问题。在本文中,我们提出了一种扫描链分区技术,由扫描保持机制支持,用于扫描测试过程中移位阶段的低功耗。在内置自检(BIST)或基于非BIST扫描的测试环境中都可以实现大幅降低功耗,而不会增加测试应用时间,降低故障覆盖率,扫描单元重新排序和时钟门控。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Low power scan by partitioning and scan hold
Scan testing dynamic power consumption can induce reliability problems in the circuit under test (CUT) during manufacturing testing. In this paper, we propose a scan chain partitioning technique, supported by a scan hold mechanism, for low power dissipation during the shift phase of the scan testing procedures. Substantial power reductions can be achieved either in built-in self test (BIST) or non-BIST scan-based testing environments, without test application time increase, fault coverage decrease, scan cell reordering and clock gating.
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