Fab效率的预后/诊断健康管理系统(PHM)

C. Sun, K. Nguyen, Long Vu, S. Bisland
{"title":"Fab效率的预后/诊断健康管理系统(PHM)","authors":"C. Sun, K. Nguyen, Long Vu, S. Bisland","doi":"10.1109/ASMC.2006.1638797","DOIUrl":null,"url":null,"abstract":"In this work, a prognostic/diagnostic approach was made to use knowledge-based system to accelerate the process/equipment faults detection and classification. The domain knowledge within the fab environment can be either captured by PHM systems or populated by the experienced engineers. With the implementation of the proposed PHM system, domain knowledge stored in the PHM-equip and PHM-APC (advanced process control) subsystems will feed forward and feed backward through the entire process flow. For example, device information from the PHM-BE (back end) subsystems will be easily shared with process and equipment engineers. Likewise, process information from PHM-Equip and PHM-APC subsystems can also be shared with device and test engineers to achieve a fab-wide collaboration environment. These PHM systems are executed in a formal factory automation environment with all the correct compliances for equipment interface and integration plus MES connectivity","PeriodicalId":407645,"journal":{"name":"The 17th Annual SEMI/IEEE ASMC 2006 Conference","volume":"96 10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Prognostic/Diagnostic Health Management System (PHM) for Fab Efficiency\",\"authors\":\"C. Sun, K. Nguyen, Long Vu, S. Bisland\",\"doi\":\"10.1109/ASMC.2006.1638797\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, a prognostic/diagnostic approach was made to use knowledge-based system to accelerate the process/equipment faults detection and classification. The domain knowledge within the fab environment can be either captured by PHM systems or populated by the experienced engineers. With the implementation of the proposed PHM system, domain knowledge stored in the PHM-equip and PHM-APC (advanced process control) subsystems will feed forward and feed backward through the entire process flow. For example, device information from the PHM-BE (back end) subsystems will be easily shared with process and equipment engineers. Likewise, process information from PHM-Equip and PHM-APC subsystems can also be shared with device and test engineers to achieve a fab-wide collaboration environment. These PHM systems are executed in a formal factory automation environment with all the correct compliances for equipment interface and integration plus MES connectivity\",\"PeriodicalId\":407645,\"journal\":{\"name\":\"The 17th Annual SEMI/IEEE ASMC 2006 Conference\",\"volume\":\"96 10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-05-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The 17th Annual SEMI/IEEE ASMC 2006 Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASMC.2006.1638797\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The 17th Annual SEMI/IEEE ASMC 2006 Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASMC.2006.1638797","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

摘要

本文提出了一种基于知识的预测/诊断方法,以加速过程/设备故障的检测和分类。工厂环境中的领域知识既可以由PHM系统捕获,也可以由经验丰富的工程师填充。随着所提出的PHM系统的实施,存储在PHM-equip和PHM- apc(高级过程控制)子系统中的领域知识将通过整个过程流进行前馈和后馈。例如,来自PHM-BE(后端)子系统的设备信息将很容易与过程和设备工程师共享。同样,来自PHM-Equip和PHM-APC子系统的过程信息也可以与设备和测试工程师共享,以实现整个晶圆厂的协作环境。这些PHM系统在正式的工厂自动化环境中执行,具有设备接口和集成以及MES连接的所有正确遵从性
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Prognostic/Diagnostic Health Management System (PHM) for Fab Efficiency
In this work, a prognostic/diagnostic approach was made to use knowledge-based system to accelerate the process/equipment faults detection and classification. The domain knowledge within the fab environment can be either captured by PHM systems or populated by the experienced engineers. With the implementation of the proposed PHM system, domain knowledge stored in the PHM-equip and PHM-APC (advanced process control) subsystems will feed forward and feed backward through the entire process flow. For example, device information from the PHM-BE (back end) subsystems will be easily shared with process and equipment engineers. Likewise, process information from PHM-Equip and PHM-APC subsystems can also be shared with device and test engineers to achieve a fab-wide collaboration environment. These PHM systems are executed in a formal factory automation environment with all the correct compliances for equipment interface and integration plus MES connectivity
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信