肖特基二极管沟槽功率场效应管的单片集成

Y. Gao, Jie Chen, A. Huang
{"title":"肖特基二极管沟槽功率场效应管的单片集成","authors":"Y. Gao, Jie Chen, A. Huang","doi":"10.1109/IPEMC.2006.4777958","DOIUrl":null,"url":null,"abstract":"A monolithic integration of trench power JFET with Schottky diode is proposed and analyzed. A unit JFET cell pitch of 1.1 um can be obtained. The specific on-resistance of the device is reduced to 14.4 mOmegamiddotmm2 which is close to state-of-art of power MOSFET. Two approaches for the integrated Schottky diode -junction barrier Schottky (JBS) and planar Schottky diode (PSD) - are analyzed and compared. The integrated JBS diode shows 28% and 30% reduction while the integrated PSD shows 30% and 32% reduction on forward voltage drop and reverse recovery charge respectively compared with its p-n counterpart from the same integration technology","PeriodicalId":448315,"journal":{"name":"2006 CES/IEEE 5th International Power Electronics and Motion Control Conference","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Monolithic Integration of Trench Power JFET with Schottky Diode\",\"authors\":\"Y. Gao, Jie Chen, A. Huang\",\"doi\":\"10.1109/IPEMC.2006.4777958\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A monolithic integration of trench power JFET with Schottky diode is proposed and analyzed. A unit JFET cell pitch of 1.1 um can be obtained. The specific on-resistance of the device is reduced to 14.4 mOmegamiddotmm2 which is close to state-of-art of power MOSFET. Two approaches for the integrated Schottky diode -junction barrier Schottky (JBS) and planar Schottky diode (PSD) - are analyzed and compared. The integrated JBS diode shows 28% and 30% reduction while the integrated PSD shows 30% and 32% reduction on forward voltage drop and reverse recovery charge respectively compared with its p-n counterpart from the same integration technology\",\"PeriodicalId\":448315,\"journal\":{\"name\":\"2006 CES/IEEE 5th International Power Electronics and Motion Control Conference\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 CES/IEEE 5th International Power Electronics and Motion Control Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPEMC.2006.4777958\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 CES/IEEE 5th International Power Electronics and Motion Control Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPEMC.2006.4777958","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

提出并分析了一种沟槽功率场效应管与肖特基二极管的单片集成。可以获得1.1 um的单元JFET电池节距。该器件的比导通电阻降至14.4 mOmegamiddotmm2,接近功率MOSFET的最新水平。对集成肖特基二极管的两种方法——结势垒肖特基二极管(JBS)和平面肖特基二极管(PSD)进行了分析和比较。集成的JBS二极管与采用相同集成技术的p-n二极管相比,正向压降和反向恢复电荷分别降低了28%和30%,集成的PSD分别降低了30%和32%
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Monolithic Integration of Trench Power JFET with Schottky Diode
A monolithic integration of trench power JFET with Schottky diode is proposed and analyzed. A unit JFET cell pitch of 1.1 um can be obtained. The specific on-resistance of the device is reduced to 14.4 mOmegamiddotmm2 which is close to state-of-art of power MOSFET. Two approaches for the integrated Schottky diode -junction barrier Schottky (JBS) and planar Schottky diode (PSD) - are analyzed and compared. The integrated JBS diode shows 28% and 30% reduction while the integrated PSD shows 30% and 32% reduction on forward voltage drop and reverse recovery charge respectively compared with its p-n counterpart from the same integration technology
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