一种具有缺陷容忍度的模式匹配处理器阵列

T. Kawada, Y. Takahashi, N. Tsuda, M. Waki, N. Hagiwara
{"title":"一种具有缺陷容忍度的模式匹配处理器阵列","authors":"T. Kawada, Y. Takahashi, N. Tsuda, M. Waki, N. Hagiwara","doi":"10.1109/ISSCC.1986.1156985","DOIUrl":null,"url":null,"abstract":"A 16b processor chip with sorter and 32Kb dictionary RAM has been developed for hand-printed Kanji character recognition. This paper will describe the design techniques used to achieve defect tolerance in the memory and logic blocks. A 18.5×20.5mm2chip contains 460,000 transistors using a 3μm double metal CMOS technology.","PeriodicalId":440688,"journal":{"name":"1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"80 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"A pattern matching processor array with defect tolerance\",\"authors\":\"T. Kawada, Y. Takahashi, N. Tsuda, M. Waki, N. Hagiwara\",\"doi\":\"10.1109/ISSCC.1986.1156985\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A 16b processor chip with sorter and 32Kb dictionary RAM has been developed for hand-printed Kanji character recognition. This paper will describe the design techniques used to achieve defect tolerance in the memory and logic blocks. A 18.5×20.5mm2chip contains 460,000 transistors using a 3μm double metal CMOS technology.\",\"PeriodicalId\":440688,\"journal\":{\"name\":\"1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"volume\":\"80 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.1986.1156985\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1986.1156985","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

摘要

开发了一种16b处理器芯片,该芯片具有分选器和32Kb字典内存,可用于手印汉字识别。本文将描述用于实现内存和逻辑块缺陷容忍度的设计技术。18.5×20.5mm2chip采用3μm双金属CMOS技术,包含46万个晶体管。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A pattern matching processor array with defect tolerance
A 16b processor chip with sorter and 32Kb dictionary RAM has been developed for hand-printed Kanji character recognition. This paper will describe the design techniques used to achieve defect tolerance in the memory and logic blocks. A 18.5×20.5mm2chip contains 460,000 transistors using a 3μm double metal CMOS technology.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信