用于高性能模拟应用的全耗尽双栅SOI mosfet横向非对称通道设计分析

A. Kranti, T. M. Chung, D. Flandre, J. Raskin
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引用次数: 2

摘要

基于分析建模、二维仿真和实验结果,本工作证明了在DG SOI mosfet中使用均匀掺杂的横向不对称通道设计可以获得出色的模拟性能。我们表明,DG mosfet中的非对称通道设计可以实现80 dB的直流增益,超过1200 V的早期电压和L/sub / eff = 1.64 /spl mu/m的跨导电流比接近理想值(/spl sim/38 V/sup -1/),远远超过迄今为止报道的。分析显示了利用GC - DG - mosfet实现未来高性能模拟电路的新机会。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Analysis of laterally asymmetric channel design in fully depleted double gate (DG) SOI MOSFETs for high performance analog applications
Based on analytical modeling, 2D simulation and experimental results, this work demonstrates the potential benefits of using laterally asymmetric channel design over uniform doping in DG SOI MOSFETs for achieving excellent analog performance. We show that the asymmetric channel design in DG MOSFETs makes it possible to achieve a DC gain of 80 dB, an Early voltage of over 1200 V and nearly ideal values (/spl sim/38 V/sup -1/) of transconductance-to-current ratio for L/sub eff/ = 1.64 /spl mu/m, well in excess of those reported so far. Analysis shows new opportunities for realising future high performance analog circuits with GC DG MOSFETs.
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