{"title":"Pentium/sup /spl reg// 4、Pentium/sup /spl reg// III和低功耗Pentium/sup /spl reg// MMX微处理器的单事件扰动特性","authors":"D. Hiemstra, S. Yu, M. Pop","doi":"10.1109/REDW.2002.1045532","DOIUrl":null,"url":null,"abstract":"Experimental single event upset characterization of the Pentium/sup /spl reg// 4, Pentium/sup /spl reg// III and Low Power Pentium/sup /spl reg// MMX microprocessors using proton irradiation is presented. Results are compared with previous tests on other Pentium/sup /spl reg// microprocessors.","PeriodicalId":135340,"journal":{"name":"IEEE Radiation Effects Data Workshop","volume":"57 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Single event upset characterization of the Pentium/sup /spl reg// 4, Pentium/sup /spl reg// III and low power Pentium/sup /spl reg// MMX microprocessors using proton irradiation\",\"authors\":\"D. Hiemstra, S. Yu, M. Pop\",\"doi\":\"10.1109/REDW.2002.1045532\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Experimental single event upset characterization of the Pentium/sup /spl reg// 4, Pentium/sup /spl reg// III and Low Power Pentium/sup /spl reg// MMX microprocessors using proton irradiation is presented. Results are compared with previous tests on other Pentium/sup /spl reg// microprocessors.\",\"PeriodicalId\":135340,\"journal\":{\"name\":\"IEEE Radiation Effects Data Workshop\",\"volume\":\"57 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-12-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Radiation Effects Data Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW.2002.1045532\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Radiation Effects Data Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW.2002.1045532","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Single event upset characterization of the Pentium/sup /spl reg// 4, Pentium/sup /spl reg// III and low power Pentium/sup /spl reg// MMX microprocessors using proton irradiation
Experimental single event upset characterization of the Pentium/sup /spl reg// 4, Pentium/sup /spl reg// III and Low Power Pentium/sup /spl reg// MMX microprocessors using proton irradiation is presented. Results are compared with previous tests on other Pentium/sup /spl reg// microprocessors.