{"title":"利用电荷共享的高效跃迁探测器","authors":"Yu Wang, A. Singh","doi":"10.1109/VLSID.2015.57","DOIUrl":null,"url":null,"abstract":"Transition detectors have been widely employed for online error and metastability detection, including in Better-Than-Worst-Case (BTWC) timing design of microprocessors that are designed to allow occasional timing errors. In such applications, the area overhead introduced by the transition detectors is a major concern because they may need to be incorporated in almost all the flip-flops in a large design. In this paper, we present a new transition detector (TDCS) which employs a novel combination of charge sharing effects and short circuit based discharge for operation to reduce more than half the circuit complexity of traditional designs. Simulation of our TDCS design shows that it can reliably achieve the same functionality as published designs with 60% fewer transistors. Furthermore, detailed corner analysis shows that our TDCS design is robust under extreme PVT variations.","PeriodicalId":123635,"journal":{"name":"2015 28th International Conference on VLSI Design","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-02-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"An Efficient Transition Detector Exploiting Charge Sharing\",\"authors\":\"Yu Wang, A. Singh\",\"doi\":\"10.1109/VLSID.2015.57\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Transition detectors have been widely employed for online error and metastability detection, including in Better-Than-Worst-Case (BTWC) timing design of microprocessors that are designed to allow occasional timing errors. In such applications, the area overhead introduced by the transition detectors is a major concern because they may need to be incorporated in almost all the flip-flops in a large design. In this paper, we present a new transition detector (TDCS) which employs a novel combination of charge sharing effects and short circuit based discharge for operation to reduce more than half the circuit complexity of traditional designs. Simulation of our TDCS design shows that it can reliably achieve the same functionality as published designs with 60% fewer transistors. Furthermore, detailed corner analysis shows that our TDCS design is robust under extreme PVT variations.\",\"PeriodicalId\":123635,\"journal\":{\"name\":\"2015 28th International Conference on VLSI Design\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-02-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 28th International Conference on VLSI Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSID.2015.57\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 28th International Conference on VLSI Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSID.2015.57","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An Efficient Transition Detector Exploiting Charge Sharing
Transition detectors have been widely employed for online error and metastability detection, including in Better-Than-Worst-Case (BTWC) timing design of microprocessors that are designed to allow occasional timing errors. In such applications, the area overhead introduced by the transition detectors is a major concern because they may need to be incorporated in almost all the flip-flops in a large design. In this paper, we present a new transition detector (TDCS) which employs a novel combination of charge sharing effects and short circuit based discharge for operation to reduce more than half the circuit complexity of traditional designs. Simulation of our TDCS design shows that it can reliably achieve the same functionality as published designs with 60% fewer transistors. Furthermore, detailed corner analysis shows that our TDCS design is robust under extreme PVT variations.