{"title":"具有亚皮秒测量能力的高分辨率闪光时间-数字转换器","authors":"N. Minas, D. Kinniment, G. Russell, A. Yakovlev","doi":"10.1109/ISSOC.2008.4694882","DOIUrl":null,"url":null,"abstract":"The paper presents a flash TDC implemented in a UMC 0.13 um technology node. The maximum resolution of 0.6 ps and a dynamic range of plusmn17 ps makes it ideal for measuring set-up and hold time violations and quantifying clock jitter. The method proposed has the effect of reducing the errors introduced by noise and process variations by a factor of two over present techniques. A novel method for overcoming the effects of process variability by counting the number of high outputs is also presented.","PeriodicalId":168022,"journal":{"name":"2008 International Symposium on System-on-Chip","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"High resolution flash time-to-digital converter with sub-picosecond measurement capabilities\",\"authors\":\"N. Minas, D. Kinniment, G. Russell, A. Yakovlev\",\"doi\":\"10.1109/ISSOC.2008.4694882\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper presents a flash TDC implemented in a UMC 0.13 um technology node. The maximum resolution of 0.6 ps and a dynamic range of plusmn17 ps makes it ideal for measuring set-up and hold time violations and quantifying clock jitter. The method proposed has the effect of reducing the errors introduced by noise and process variations by a factor of two over present techniques. A novel method for overcoming the effects of process variability by counting the number of high outputs is also presented.\",\"PeriodicalId\":168022,\"journal\":{\"name\":\"2008 International Symposium on System-on-Chip\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-12-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 International Symposium on System-on-Chip\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSOC.2008.4694882\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Symposium on System-on-Chip","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSOC.2008.4694882","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
High resolution flash time-to-digital converter with sub-picosecond measurement capabilities
The paper presents a flash TDC implemented in a UMC 0.13 um technology node. The maximum resolution of 0.6 ps and a dynamic range of plusmn17 ps makes it ideal for measuring set-up and hold time violations and quantifying clock jitter. The method proposed has the effect of reducing the errors introduced by noise and process variations by a factor of two over present techniques. A novel method for overcoming the effects of process variability by counting the number of high outputs is also presented.
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