故障小电流触点的电热状态模拟

Gideon-Gwanzuwang Dankat, L. Dumitran
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引用次数: 0

摘要

在早期的文献中已经提出,电连接器热模拟的准确性与接触电阻密切相关。电连接器中的接触电阻是由于收缩电阻(由电流流过电连接器的狭窄路径引起)和薄膜电阻(由材料的高电阻率和大气中的杂质等引起的氧化金属)而产生的。本文通过在COMSOL Multiphysics中对一个简单接触模型的接触温升进行热电耦合有限元模拟(FEM),回顾了氧化和磨损对电连接器的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
SIMULATION OF ELECTRO-THERMAL CONDITION IN A FAULTY LOW-CURRENT CONTACT
It has been suggested in earlier literature that the accuracy of the thermal simulation of electrical connectors is closely related to contact resistance. Contact resistance in electrical connectors occurs due to both constriction resistance (caused by narrow paths in which the current flows through the electrical connector) and film resistance (oxidized metals caused by the high resistivity of materials and impurities from the atmosphere etc.). This paper reviews the oxidation and wear affecting electrical connectors by proposing a thermal-electrical coupled finite element simulation (FEM) of the contact temperature rise of a simple contact model in COMSOL Multiphysics.
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