量子点器件中的超快过程

P. Borri, W. Langbein, S. Schneider, U. Woggon, R. Sellin, D. Ouyang, D. Bimberg
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引用次数: 1

摘要

采用高灵敏度外差技术,在10K下测量了以InGaAs/GaAs量子点为有源介质的电泵浦半导体光放大器中激子基态跃迁的消相时间和居群弛豫动力学。电注入势垒区导致激子跃迁的纯减相。一旦注入的载流子填充了电子基态,激发态的额外填充产生了多激子,由于人口松弛而表现出快速的减相。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Ultrafast processes in quantum dot devices
The dephasing time and the population relaxation dynamics of the excitonic ground-state transitions in an electrically-pumped semiconductor optical amplifier containing InGaAs/GaAs quantum dots as active medium are measured at 10K using a highly sensitive heterodyne technique. Electrical injection into the barrier region results in a pure dephasing of the excitonic transitions. Once the injected carriers have filled the electronic ground state, additional filling of the excited states creates multiexcitons that show a fast dephasing due to population relaxation.
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