一种0.12µm SiGe BiCMOS工艺的q波段/ w波段双频功率放大器

Po-Yi Wu, J. Buckwalter
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引用次数: 7

摘要

采用0.12 um硅锗(SiGe) BiCMOS工艺,在q波段和w波段设计了一种三级双频功率放大器。前两级是带高阻抗双带负载的伪差分前置放大器。最后一级是单端功率放大器,具有适当的阻抗来产生输出功率。放大器的集电极-发射极结击穿电压通过低阻抗基极电流偏置网络得到扩展。该放大器在43 GHz和82 GHz时的最大饱和功率分别为14 dBm和9 dBm,峰值功率增加效率(PAE)为15%。有效芯片面积为1mm2,包括输入和输出RF GSG焊盘。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Q-Band/W-Band Dual-Band Power Amplifier in 0.12 µm SiGe BiCMOS Process
A three-stage dual-band power amplifier is demonstrated in 0.12 um silicon germanium (SiGe) BiCMOS process at both Q-band and W-band. The first two stages are pseudo-differential pre-amplifiers with a high-impedance dual-band load. The final stage is a single-ended power amplifier with an appropriate impedance to produce output power. The collector-emitter junction breakdown voltage of the amplifier is extended with a low-impedance base current biasing network. The amplifier achieves a peak power-added efficiency (PAE) of 15% with 14 dBm maximum saturated power (Psat) at 43 GHz and 9 dBm Psat at 82 GHz. The effective chip area is 1mm2 including input and output RF GSG pads.
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