{"title":"时域电压测量的瞬态电流提取","authors":"Y. Zhou, B. Herberg","doi":"10.1109/EPEP.2004.1407572","DOIUrl":null,"url":null,"abstract":"An easy method to extract the current signature of a core power supply is suggested and to measure the impedance of the PDS and the voltage at the interface of interest. With modern electromagnetic simulation tools such as SPEED2000 the impedance measurement of the PDS can be eliminated, replaced by a simple time domain simulation. It is used to obtain the transient current during HRESET of a microprocessor system.","PeriodicalId":143349,"journal":{"name":"Electrical Performance of Electronic Packaging - 2004","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-10-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Transient current extraction from time domain voltage measurement\",\"authors\":\"Y. Zhou, B. Herberg\",\"doi\":\"10.1109/EPEP.2004.1407572\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An easy method to extract the current signature of a core power supply is suggested and to measure the impedance of the PDS and the voltage at the interface of interest. With modern electromagnetic simulation tools such as SPEED2000 the impedance measurement of the PDS can be eliminated, replaced by a simple time domain simulation. It is used to obtain the transient current during HRESET of a microprocessor system.\",\"PeriodicalId\":143349,\"journal\":{\"name\":\"Electrical Performance of Electronic Packaging - 2004\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-10-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Performance of Electronic Packaging - 2004\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.2004.1407572\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Performance of Electronic Packaging - 2004","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2004.1407572","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Transient current extraction from time domain voltage measurement
An easy method to extract the current signature of a core power supply is suggested and to measure the impedance of the PDS and the voltage at the interface of interest. With modern electromagnetic simulation tools such as SPEED2000 the impedance measurement of the PDS can be eliminated, replaced by a simple time domain simulation. It is used to obtain the transient current during HRESET of a microprocessor system.
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