用于内存测试的嵌入式行军算法测试模式生成器

1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers. (Cat. No.99TH8453) Pub Date : 1999-06-08 DOI:10.1109/VTSA.1999.786037

Wei-Lun Wang, Kuen-Jong Lee, Jhing-Fa Wang

{"title":"用于内存测试的嵌入式行军算法测试模式生成器","authors":"Wei-Lun Wang, Kuen-Jong Lee, Jhing-Fa Wang","doi":"10.1109/VTSA.1999.786037","DOIUrl":null,"url":null,"abstract":"The memory cores are essential for a system-on-a-chip (SOC). To test the memory cores, in this paper we propose a generalized embedded test pattern generator for any march algorithm. Without loss of functionality of the march algorithm, we also present a systematic procedure with a short time complexity to reduce the hardware cost of the test pattern generator.","PeriodicalId":237214,"journal":{"name":"1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers. (Cat. No.99TH8453)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"An embedded march algorithm test pattern generator for memory testing\",\"authors\":\"Wei-Lun Wang, Kuen-Jong Lee, Jhing-Fa Wang\",\"doi\":\"10.1109/VTSA.1999.786037\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The memory cores are essential for a system-on-a-chip (SOC). To test the memory cores, in this paper we propose a generalized embedded test pattern generator for any march algorithm. Without loss of functionality of the march algorithm, we also present a systematic procedure with a short time complexity to reduce the hardware cost of the test pattern generator.\",\"PeriodicalId\":237214,\"journal\":{\"name\":\"1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers. (Cat. No.99TH8453)\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-06-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers. (Cat. No.99TH8453)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTSA.1999.786037\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers. (Cat. No.99TH8453)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTSA.1999.786037","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 3

摘要

存储核心对于片上系统(SOC)是必不可少的。为了测试存储核，本文提出了一种通用的嵌入式测试模式生成器，适用于任意行军算法。在不损失行军算法功能的前提下，我们还提出了一种具有短时间复杂度的系统程序，以降低测试模式生成器的硬件成本。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

An embedded march algorithm test pattern generator for memory testing

The memory cores are essential for a system-on-a-chip (SOC). To test the memory cores, in this paper we propose a generalized embedded test pattern generator for any march algorithm. Without loss of functionality of the march algorithm, we also present a systematic procedure with a short time complexity to reduce the hardware cost of the test pattern generator.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers. (Cat. No.99TH8453)

自引率

0.00%

发文量