{"title":"用于喷墨印刷电阻和电容结构测量的虚拟系统","authors":"G. Nikolov, E. Gieva, B. Nikolova, I. Ruskova","doi":"10.1109/MIEL.2019.8889597","DOIUrl":null,"url":null,"abstract":"The presented article describes the method and sequence in creating a virtual measurement system using a modern LabView-controlled measuring instrument. We have implemented a virtual environment for measuring different electrical characteristics of printed resistive and capacitive sensor structures through Inkjet technology. The determination of different parameters of the printed structures makes it possible to characterize them and to determine their applications.","PeriodicalId":391606,"journal":{"name":"2019 IEEE 31st International Conference on Microelectronics (MIEL)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Virtual System for Measurement of Inkjet Printed Resistive and Capacitive Structures\",\"authors\":\"G. Nikolov, E. Gieva, B. Nikolova, I. Ruskova\",\"doi\":\"10.1109/MIEL.2019.8889597\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The presented article describes the method and sequence in creating a virtual measurement system using a modern LabView-controlled measuring instrument. We have implemented a virtual environment for measuring different electrical characteristics of printed resistive and capacitive sensor structures through Inkjet technology. The determination of different parameters of the printed structures makes it possible to characterize them and to determine their applications.\",\"PeriodicalId\":391606,\"journal\":{\"name\":\"2019 IEEE 31st International Conference on Microelectronics (MIEL)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE 31st International Conference on Microelectronics (MIEL)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MIEL.2019.8889597\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 31st International Conference on Microelectronics (MIEL)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MIEL.2019.8889597","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Virtual System for Measurement of Inkjet Printed Resistive and Capacitive Structures
The presented article describes the method and sequence in creating a virtual measurement system using a modern LabView-controlled measuring instrument. We have implemented a virtual environment for measuring different electrical characteristics of printed resistive and capacitive sensor structures through Inkjet technology. The determination of different parameters of the printed structures makes it possible to characterize them and to determine their applications.