微处理器故障分析中的锁存器发散

International Test Conference, 2003. Proceedings. ITC 2003. Pub Date : 2003-09-30 DOI:10.1109/TEST.2003.1270905

P. Dahlgren, P. Dickinson, I. Parulkar

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引用次数: 48

摘要

本文提出了一种分析通过扫描链观察到的系统状态差异的方法，用于功能故障的调试。提出了一种新的锁存散度分析(LDA)方法，以产生稳定的故障特征并降低系统噪声。该方法和处理流程已集成到UltraSPARCTM系列处理器的正常调试流程中，并已成功地应用于新产品开发中的许多调试中。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Latch divergency in microprocessor failure analysis

This paper presents an approach for analysis of system state differences observable through the scan chain for the debug of functional failures. A novel methodology for Latch Divergence Analysis (LDA) is proposed for creating stable failure signatures and reducing system noise. The methodology and processing flow have been integrated into the normal debug flow for the UltraSPARCTM family processors and have been successfully applied in numerous debugs in the bring-up of new products.

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来源期刊

International Test Conference, 2003. Proceedings. ITC 2003.

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