结温测量优化LED阵列热设计

H. Ye, Hongyu Tang, S. Leung, C. Qian, Xuejun Fan, Guoqi Zhang
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引用次数: 4

摘要

高亮度发光二极管(HB LED)增加电流输入、实现高流明输出的驱动导致了一系列的热问题。因此,热管理是关键的设计参数之一,因为温度直接影响最大光输出、质量、可靠性和寿命。对于LED阵列来说,芯片的排列将影响其热性能,结温在设计中非常重要。然而,由于封装的原因,直接结温测定难以检测,间接方法更受欢迎。其中,二极管正向电压法是精度最高的一种。因此,我们采用二极管正向电压的方法来优化LED阵列的热设计。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Junction temperature measurement to optimize thermal design of LED arrays
The drive to increase electrical currents input, and to achieve high lumen output for High Brightness Light Emitting Diode (HB LED) has led to a series of thermal problems. Hence, thermal management is one of key design parameters as the temperature directly affecting the maximum light output, quality, reliability and life time. For LED arrays, the arrangement of chips will affect the thermal performance and junction temperature is very important in the design. However, because direct junction temperature determination is hard to detect due to the encapsulation, indirect methods are more preferred. Among them, the diode forward-voltage method is the most accurate one. Therefore, we used the diode forward-voltage method to optimize thermal design of LED arrays in this work.
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