碳化硅中单光子中心的制备

B. C. Johnson, S. Castelletto, T. Ohshima, T. Umeda
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引用次数: 1

摘要

报道了块状4H碳化硅(SiC)中孤立缺陷的明亮室温单光子发射。给出了该缺陷在700 nm左右发射的光物理性质。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Fabrication of single photon centres in silicon carbide
Bright room temperature single photon emission from isolated defects in bulk 4H silicon carbide (SiC) is reported. The photo-physical properties of the defect, having emission around 700 nm is presented.
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