弹性分组环ASIC设计中DFT策略的设计与实现

Fan Zhang, Jishi Li, Hong Chen, Depeng Jin, Lieguang Zeng
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引用次数: 1

摘要

根据弹性分组环(RPR)专用集成电路(ASIC)的实际测试需求,提出了综合应用三种不同DFT方法的可测试性设计(DFT)策略。介绍了扫描链、边界扫描测试(BST)、内存内置自检(MBIST)等策略的原理和关键方法。详细分析了DFT策略的实施过程和效果。在RPR专用集成电路中实现DFT电路,大大降低了测试难度,提高了故障覆盖率。合理综合地采用DFT技术是非常重要的
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design and implementation of DFT strategy in ASIC design of resilient packet ring
According to the practical test requirements of resilient packet ring (RPR) application specific integrated circuit (ASIC), design for testability (DFT) strategy that applies three different DFT methods compositively is proposed in this paper. Principles and key methods used in the strategy are introduced, including scan chain, boundary scan test (BST), memory built-in-self-test (MBIST). Implementation process and results of the DFT strategy are analyzed in detail. DFT circuits implemented in RPR ASIC have reduced the difficulty of test and improved fault coverage a lot. Adopting DFT techniques logically and compositively is very important
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