{"title":"自动验证行军测试(sram)","authors":"A. van de Goor, B. Smit","doi":"10.1109/MT.1993.263136","DOIUrl":null,"url":null,"abstract":"Completeness and irredundancy proofs for SRAM march tests can be quite complicated. The authors present a method to automatically verify march tests. This method can be adapted for any other memory test. They present a way of modelling faults mathematically and describe how the verification process has been automated.<<ETX>>","PeriodicalId":248811,"journal":{"name":"Records of the 1993 IEEE International Workshop on Memory Testing","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":"{\"title\":\"Automatic verification of march tests (SRAMs)\",\"authors\":\"A. van de Goor, B. Smit\",\"doi\":\"10.1109/MT.1993.263136\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Completeness and irredundancy proofs for SRAM march tests can be quite complicated. The authors present a method to automatically verify march tests. This method can be adapted for any other memory test. They present a way of modelling faults mathematically and describe how the verification process has been automated.<<ETX>>\",\"PeriodicalId\":248811,\"journal\":{\"name\":\"Records of the 1993 IEEE International Workshop on Memory Testing\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-08-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"14\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Records of the 1993 IEEE International Workshop on Memory Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MT.1993.263136\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Records of the 1993 IEEE International Workshop on Memory Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MT.1993.263136","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Completeness and irredundancy proofs for SRAM march tests can be quite complicated. The authors present a method to automatically verify march tests. This method can be adapted for any other memory test. They present a way of modelling faults mathematically and describe how the verification process has been automated.<>