利用全波解算器对高速噪声源的电磁干扰进行准确预测和抑制

Qiaolei Huang, Deepak Pai, K. Rao, Akshay Mohan, Jaswanth N. Vutukury, Chien-Ming Nieh, J. Fan, Jagan Rajagopalan
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引用次数: 6

摘要

意外电磁干扰(EMI)在所有消费电子产品中都很常见,当不遵循接地,屏蔽和整体系统集成的最佳实践时,通常会超出FCC和/或CE的合规范围。对电磁干扰法规遵从性的测量已经进行了广泛的研究,并且有标准的测试实验室对电磁干扰进行认证。然而,由于设备和噪声源建模的复杂性,通过仿真来预测消费电子设备的电磁干扰辐射是非常具有挑战性的。本文介绍了一种模拟电子器件中由片上系统(SoC)产生的208 MHz单端I/O时钟的电磁干扰辐射的工作流程。通过全波三维求解,得到了时钟的辐射远场传递函数。此外,还在时域和频域测量了时钟的频谱含量。然后将时钟谱与传递函数相结合,预测电磁干扰辐射包络线。然后将模拟结果与FCC兼容实验室的测量结果进行比较。根据模拟和测量结果,提出了将电磁干扰降低到可接受水平的缓解技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Accurate Prediction and Mitigation of EMI from High-Speed Noise Sources using Full Wave Solver
Unintended Electromagnetic interference (EMI) is a common occurrence in all consumer electronics, which can often fail compliance margins of FCC and/or CE, when best practices of grounding, shielding and overall system integration are not followed. The measurement of EMI for regulatory compliance has been studied extensively and there are standard test labs which certifies for EMI. However, predicting the EMI radiation from a consumer electronic device through simulation is very challenging due to the complexities involved in modeling the device and noise source. This paper introduces a workflow for simulating one case of EMI radiation from a 208 MHz single-ended I/O clock generated from the System-on-Chip (SoC) in an electronic device. Through a full wave 3D solver, the radiated far field transfer function of the clock is obtained. Additionally, the spectral content of clock is measured in both time and frequency domain. Then the clock spectrum is combined with transfer function to predict EMI radiation envelope. The simulated results are then compared with the measured results from an FCC compliant laboratory. Based on the simulated and measured results, mitigation techniques are proposed to reduce the EMI to acceptable levels.
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