硼硅等离子体掺杂中中性气体吸收效应的贡献与控制

K. Tsutsui, R. Higaki, Y. Sasaki, T. Sato, H. Tamura, B. Mizuno, H. Iwai
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引用次数: 0

摘要

在低能等离子体掺杂过程中,不仅要考虑电离物质,还要考虑中性物质对掺杂过程的贡献。为了研究这种贡献,进行了气相掺杂与Ar或He等离子体预处理相结合的实验。气相杂质吸收应受硅衬底表面条件的影响。结果表明,在暴露于中性B/sub - 2/H/sub - 6//He气体之前,基底表面经Ar或He等离子体预处理,可显著增加中性气相硼的剂量。当表面暴露于中性B/sub 2/H/sub 6//He气体中时,衬底温度对气相杂质吸收有影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Contribution and control of neutral gas absorption effects in the plasma doping of boron into Si
In the low energy plasma doping process, the contribution of not only ionized species but also neutral species to the doping process should be considered. In order to investigate such a contribution, the experiments of gas phase doping combined with Ar or He plasma pre-treatment were carried out. Gas phase impurity absorption should be affected by surface condition of Si substrates. As a result, significant increase of boron dose from neutral gas phase was observed when the substrate surface was pre-treated by Ar or He plasma prior to exposure to neutral B/sub 2/H/sub 6//He gas. It was also found that the gas phase impurity absorption was affected by substrate temperature when the surface was exposed to the neutral B/sub 2/H/sub 6//He gas.
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