YBa2Cu3O7-d外延薄膜的实临界电流密度和材料幂律

L. Shan, S. Aruna, Xiaonong Xu, Z. Wang, X. Jin
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引用次数: 0

摘要

在aYBa2Cu3O7-δ外延薄膜上测量了其电流电压特性。利用材料幂律,我们确定了在不同场和温度下,特征钉钉电位uj和实际临界电流密度Jc对温度和场的依赖关系。结果表明,Jc与传统的由电场判据确定的临界电流密度JE完全不同。因此,历史悠久的电子场标准对高温超导体不再合理。通过进一步研究Jc和UJ的结果,我们能够描绘出钉钉势阱随温度升高而变化的物理图景,从而确定了从涡-玻璃相到涡-液相的转变点。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Real Critical Current Density and Material Power Law of YBa2Cu3O7-d Epitaxial Thin Film
The current–voltage characteristics have been measured on aYBa2Cu3O7-δ epitaxial thin film. Using a material power law, we determine the temperature and field dependencies of the characteristic pinning potential UJand the real critical current density Jc at different fields and temperatures. It is shown that Jc is completely different from the conventional critical current density JE, which is determined by the electronic-field criterion. Thus, the time-honoured electronic-field criterion is no longer reasonable for high-Tc superconductors. By further investigation of the results of Jc and UJ, we are able to present a physical picture of the transformation of the pinning potential well with increasing temperature and hence determine the transition point from vortex-glass phase to vortex-liquid phase.
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