基于分子束外延的Ge(111)衬底BaSi2薄膜的制备与表征

R. Takabe, K. Toko, K. Hara, N. Usami, T. Suemasu
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引用次数: 1

摘要

我们使用各种模板在Ge(111)衬底上生长BaSi2薄膜。首先,我们通过在热Ge上沉积Ba来制备30 nm的BaGe2模板,然后在580°e下进行分子束外延(MBE)制备BaSi2。我们成功地生长出了a轴取向的BaSi2;然而,BaSi2不是连续膜,因此,BaSi2暴露于空气后很容易氧化。接下来,我们用固相外延法(SPE)在580℃下生长3nm的BaSi2模板,初始晶核为BaSi2,然后在580℃下进行MBE。因此,我们获得了高度[100]定向的BaSi2连续薄膜。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Fabrication and characterization of BaSi2 films on Ge(111) substrates by molecular beam epitaxy
We grow BaSi2 films on Ge(111) substrates using various templates. First, we form 30 nm BaGe2 templates by deposition of Ba on hot Ge, followed by molecular beam epitaxy (MBE) at 580 °e to form BaSi2. We succeed to grow a-axis-oriented BaSi2; however BaSi2 is not a continuous film, and hence BaSi2 is easily oxidized after exposed to air. Next, we grow 3 nm BaSi2 template by solid phase epitaxy (SPE) with initial crystal nuclei BaSi2 at 580 °C, followed by MBE at 580°C. As a result, we achieved highly [100]-oriented BaSi2 continuous films.
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