一种带有真实微处理器信号总线的90纳米有源感应信号噪声测试芯片

M. Elzinga, E. Chiprout, Chidi Dike, M. Wolfe, M. Kobrinsky
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引用次数: 2

摘要

一种90纳米电感测试芯片,包括有源驱动器和片上噪声捕获能力,已经在硅中制造和测量。测试芯片的目的是使用典型的中继器长度和信号-电压轨比来量化对实际微处理器信号线的电感和电容噪声影响。测量结果表明,信号电感噪声可以潜在地与电容噪声竞争,并且在双宽结构中,可能比电容噪声产生更大的影响
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An active 90nm inductive signal noise testchip with realistic microprocessor signal buses
A 90nm inductance test chip that includes active drivers and on-die noise capture capabilities has been fabricated and measured in silicon. The purpose of the test chip was to quantify the inductive and capacitive noise effects on realistic microprocessor signal lines using typical inter-repeater lengths and signal-to-voltage-rail ratios. Measured results showed that signal inductive noise can potentially contend with capacitive noise and, in double-wide structures, can be of a greater effect than capacitive noise
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