在功率循环下运行的功率器件的可靠性特性

2015 International Semiconductor Conference (CAS) Pub Date : 2015-10-01 DOI:10.1109/SMICND.2015.7355192

Dan Simon, C. Boianceanu, G. De Mey, V. Topa

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引用次数: 2

摘要

汽车DMOS晶体管的安全工作区域(SOA)是在高功率脉冲(功率循环)下重复工作的，它比传统的单脉冲SOA低，并且依赖于晶体管的几何形状。在本文中，我们提出了一种测试系统，用于在功率循环条件下工作的各种几何形状的功率器件的可靠性表征。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Reliability characterization of power devices which operate under power cycling

The safe-operating-area (SOA) of automotive DMOS transistors, which are operated repeatedly under high power pulses (power cycling), is lower than the classical single-pulse SOA and it is dependent on the geometry of the transistor. In this paper, we present a test system for reliability characterization of power devices, of various geometries, which operate under power cycling conditions.

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2015 International Semiconductor Conference (CAS)

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