{"title":"同步偏置传输线脉冲系统的自动化","authors":"Bor-Wei Chang, Hsin-Chyh Hsu, M. Ker","doi":"10.1109/VDAT.2007.373254","DOIUrl":null,"url":null,"abstract":"Synchronous bias transmission line pulsing (SB-TLP) system is able to provide a synchronous bias voltage to transmission line pulse. It's a more useful test bench to evaluate actual circuit characteristics of electrostatic discharge (ESD) protection design with gate-driven mechanism than traditional Transmission Line Pulsing (TLP) system. It's important to set up an automatic SB-TLP system and be able to immediately analyze measured data which is more convenient to engineers. All of the instruments are controlled by a software written in LabVIEW environment to create a smart and friendly test workbench.","PeriodicalId":137915,"journal":{"name":"2007 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","volume":"63 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Automation of Synchronous Bias Transmission Line Pulsing System\",\"authors\":\"Bor-Wei Chang, Hsin-Chyh Hsu, M. Ker\",\"doi\":\"10.1109/VDAT.2007.373254\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Synchronous bias transmission line pulsing (SB-TLP) system is able to provide a synchronous bias voltage to transmission line pulse. It's a more useful test bench to evaluate actual circuit characteristics of electrostatic discharge (ESD) protection design with gate-driven mechanism than traditional Transmission Line Pulsing (TLP) system. It's important to set up an automatic SB-TLP system and be able to immediately analyze measured data which is more convenient to engineers. All of the instruments are controlled by a software written in LabVIEW environment to create a smart and friendly test workbench.\",\"PeriodicalId\":137915,\"journal\":{\"name\":\"2007 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)\",\"volume\":\"63 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-04-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VDAT.2007.373254\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VDAT.2007.373254","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Automation of Synchronous Bias Transmission Line Pulsing System
Synchronous bias transmission line pulsing (SB-TLP) system is able to provide a synchronous bias voltage to transmission line pulse. It's a more useful test bench to evaluate actual circuit characteristics of electrostatic discharge (ESD) protection design with gate-driven mechanism than traditional Transmission Line Pulsing (TLP) system. It's important to set up an automatic SB-TLP system and be able to immediately analyze measured data which is more convenient to engineers. All of the instruments are controlled by a software written in LabVIEW environment to create a smart and friendly test workbench.
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