引线框架设计,以减少成型引起的翘曲

L. Nguyen, K. Chen, P. Lee
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引用次数: 6

摘要

目前的包装趋势向更薄的封装已经推动引线框架制造技术的极限。例如,使用超薄小轮廓封装(utsop),总外形尺寸小于0.5 mm厚,约为当前标准IC封装中使用的典型引线框架厚度的两倍。因此,引线框架必须与封装组件的其余部分适当缩小。较薄的引线框架库存带来了许多处理困难。最重要的是由成型引起的应力引起的引线框的弯曲和扭曲。由此产生的变形影响后续的后成型步骤,如修整和成形,并可能严重增加生产成品率损失,由于铅的非共面性。本研究解决了制造和设计问题,涉及到最小化这些成型引起的应力。通过对工艺参数的良好控制(例如,成型后处理,冷却,去闪光程序等)和引线框架设计(例如,在引线框架条内的封装相对定位,减压孔和槽,加强支撑条等)的结合,可以减少由热机械应力引起的引线框架翘曲。本文将介绍各种引线框架设计的有限元模拟翘曲预测
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Leadframe designs for minimum molding-induced warpage
The current packaging trend toward thinner packages has pushed the leadframe manufacturing technology to the limits. For instance, with Ultra Thin Small Outline Packages (UTSOPs), the total form factor is less than 0.5 mm thick, which is about twice the thickness of the typical leadframe used in current standard IC packages. Thus, the leadframe must be scaled down appropriately with the rest of the package components. The thinner leadframe stock brings a host of handling difficulties. Most important of all is the bending and twisting of the leadframes caused by molding induced stresses. The resulting deformation affects the subsequent post-molding steps such as trim and form, and may seriously increase the production yield loss due to lead non-coplanarity. This study addresses the manufacturing and design issues involved with minimizing these molding-induced stresses. Through a combination of good control on the process parameters (e.g., post-molding handling, cooling, deflash procedures, etc.) and leadframe designs (e.g., package relative positioning within the leadframe strips, relief holes and slots, strengthened support strips, etc.), leadframe warpage from thermomechanical stresses can be reduced. Warpage predictions from finite element simulation will be presented for various leadframe designs in this paper.<>
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