{"title":"具有265个挑战响应对的强亚阈值电流阵列PUF,可抵御130nm CMOS中的机器学习攻击","authors":"Xiaodan Xi, Haoyu Zhuang, Nan Sun, M. Orshansky","doi":"10.23919/VLSIC.2017.8008503","DOIUrl":null,"url":null,"abstract":"This paper presents a strong silicon physically unclonable function (PUF) immune to machine learning (ML) attacks. The PUF, termed the subthreshold current array (SCA) PUF, is composed of a pair of two-dimensional transistor arrays and a low-offset comparator. The fabricated PUF chip allows 265 challenge-response pairs (CRPs) and achieves high reliability with average bit error rate (BER) of 5.8% for temperatures −20 to 80°C and Vdd + 10%. The calibration-based CRPs filtering method effectively improves BER to 2.6% with a 10% loss of CRPs. When subjected to ML attacks, the PUF shows resilience that is 100X higher than known alternatives, with negligible loss in PUF unpredictability.","PeriodicalId":176340,"journal":{"name":"2017 Symposium on VLSI Circuits","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"52","resultStr":"{\"title\":\"Strong subthreshold current array PUF with 265 challenge-response pairs resilient to machine learning attacks in 130nm CMOS\",\"authors\":\"Xiaodan Xi, Haoyu Zhuang, Nan Sun, M. Orshansky\",\"doi\":\"10.23919/VLSIC.2017.8008503\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a strong silicon physically unclonable function (PUF) immune to machine learning (ML) attacks. The PUF, termed the subthreshold current array (SCA) PUF, is composed of a pair of two-dimensional transistor arrays and a low-offset comparator. The fabricated PUF chip allows 265 challenge-response pairs (CRPs) and achieves high reliability with average bit error rate (BER) of 5.8% for temperatures −20 to 80°C and Vdd + 10%. The calibration-based CRPs filtering method effectively improves BER to 2.6% with a 10% loss of CRPs. When subjected to ML attacks, the PUF shows resilience that is 100X higher than known alternatives, with negligible loss in PUF unpredictability.\",\"PeriodicalId\":176340,\"journal\":{\"name\":\"2017 Symposium on VLSI Circuits\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"52\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 Symposium on VLSI Circuits\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/VLSIC.2017.8008503\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 Symposium on VLSI Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/VLSIC.2017.8008503","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Strong subthreshold current array PUF with 265 challenge-response pairs resilient to machine learning attacks in 130nm CMOS
This paper presents a strong silicon physically unclonable function (PUF) immune to machine learning (ML) attacks. The PUF, termed the subthreshold current array (SCA) PUF, is composed of a pair of two-dimensional transistor arrays and a low-offset comparator. The fabricated PUF chip allows 265 challenge-response pairs (CRPs) and achieves high reliability with average bit error rate (BER) of 5.8% for temperatures −20 to 80°C and Vdd + 10%. The calibration-based CRPs filtering method effectively improves BER to 2.6% with a 10% loss of CRPs. When subjected to ML attacks, the PUF shows resilience that is 100X higher than known alternatives, with negligible loss in PUF unpredictability.