正交自旋转移MRAM

D. Bedau, D. Backes, H. Liu, J. Langer, P. Manandhar, A. Kent
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引用次数: 0

摘要

自旋转移磁随机存取存储器(ST-MRAM)设备作为通用存储器具有很大的前景[Katine 2008]。ST-MRAM是非易失性的,具有小电池尺寸,高耐用性,并且可以匹配SRAM的速度。普通共线磁化ST-MRAM的缺点是其切换过程不确定,导致切换时间长,切换时间分布宽[Devolder 2008, Koch 2004]。这种延迟是由于如果层是平行或反平行的,则转矩为零[Slonczewski 1996],因此切换不能仅由转矩启动。典型的过程是由热激发引起的自由层的初始不对准开始的。依靠热启动导致非相干反转,其潜伏期在ns范围内不可预测[Devolder 2008]和宽开关时间分布[Koch 2004]。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Orthogonal spin transfer MRAM
Spin-Transfer Magnetic Random Access Memory (ST-MRAM) devices hold great promise as a universal memory [Katine 2008]. ST-MRAM is non-volatile, has a small cell size, high endurance and may match the speed of SRAM. A disadvantage of the common collinearly magnetized ST-MRAM is their non-deterministic switching process, which leads to long switching times and broad switching time distributions [Devolder 2008, Koch 2004]. This delay is due to the fact that the torque is zero if the layers are either parallel or antiparallel [Slonczewski 1996] and hence switching cannot be initiated by the torque alone. Typically the process is started by an initial misalignment of the free layer stemming from thermal excitations. Relying on thermal initiation leads to incoherent reversal with an unpredictable incubation delay in the ns range [Devolder 2008] and broad switching time distributions [Koch 2004]
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