用于3d包装的中密度硅孔聚合物填充

P. Chausse, M. Bouchoucha, D. Henry, N. Sillon, L. Chapelon
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引用次数: 29

摘要

在本文中,我们介绍了一些工艺发展和聚合物材料的评估,以实现3D-WLP通过完全填充。用于这些研究的测试晶圆要么是专门设计用于确定通过填充过程窗口的具有几个孔尺寸的毯子,要么是具有图案和堆叠的晶圆,这些晶圆是由真正的机顶盒演示器产生的。首先,提出了需要通过填充完成的演示器的3D-WLP集成方案。然后描述了通过填充行为表征所需的不同测试结构和模式。讨论了两种通过填充的方法:液体聚合物的自旋法和干膜抗蚀剂的真空辅助层压法。给出了两种方法有关专用聚合物填充形貌的一些结果。然后,给出并解释了用于选择聚合物的化学、机械和电学性能的定义集。最后,对满足先前定义要求的材料进行了评价和表征。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Polymer filling of medium density through silicon via for 3D-packaging
In this paper, we present some process developments and polymer material evaluations done to achieve the complete filling of 3D-WLP via. The test wafers used for these studies were either blankets with several via sizes specifically designed to determine via filling process window, or wafers with patterns and stacking which result from a real set-top box demonstrator. Initially, the 3D-WLP integration scheme of the demonstrator which required complete via filling is presented. Then the different test structures and patterns needed to characterize via filling behavior are described. Two methods for via filling are exposed and discussed: spin-on process of liquid polymers and vacuum assisted lamination of dry film resists. Some results concerning filling morphology with dedicated polymers are presented for both methods. After that, the defined set of chemical, mechanical and electrical properties chosen to select the polymers is given and explained. Finally, some materials which fulfill previously defined requirements are evaluated and characterized.
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