igbt电压源和电流源栅极驱动器的实验比较

Christoph Ludecke, G. Engelmann, Karl Oberdieck, David Bundgen, R. D. De Doncker
{"title":"igbt电压源和电流源栅极驱动器的实验比较","authors":"Christoph Ludecke, G. Engelmann, Karl Oberdieck, David Bundgen, R. D. De Doncker","doi":"10.1109/PEDS.2017.8289280","DOIUrl":null,"url":null,"abstract":"In this work, a current source gate driver based on a switched current mirror topology for an insulated-gate bipolar transistor (IGBT) is presented. The influence of different gate current levels for the turn-on and turn-off events is investigated. Experimental measurements are conducted using a double pulse test bench. The resulting switching trajectories as well as switching losses are compared to a standard push-pull driver stage using a variation of different gate resistors. It is found that the measured switching waveforms of the standard push-pull gate driver and the current source gate driver show equal performance. Furthermore, equal switching losses are found for equal overvoltage peaks and overcurrent peaks using both driver topologies.","PeriodicalId":411916,"journal":{"name":"2017 IEEE 12th International Conference on Power Electronics and Drive Systems (PEDS)","volume":"63 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Experimental comparison of voltage and current source gate drivers for IGBTs\",\"authors\":\"Christoph Ludecke, G. Engelmann, Karl Oberdieck, David Bundgen, R. D. De Doncker\",\"doi\":\"10.1109/PEDS.2017.8289280\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, a current source gate driver based on a switched current mirror topology for an insulated-gate bipolar transistor (IGBT) is presented. The influence of different gate current levels for the turn-on and turn-off events is investigated. Experimental measurements are conducted using a double pulse test bench. The resulting switching trajectories as well as switching losses are compared to a standard push-pull driver stage using a variation of different gate resistors. It is found that the measured switching waveforms of the standard push-pull gate driver and the current source gate driver show equal performance. Furthermore, equal switching losses are found for equal overvoltage peaks and overcurrent peaks using both driver topologies.\",\"PeriodicalId\":411916,\"journal\":{\"name\":\"2017 IEEE 12th International Conference on Power Electronics and Drive Systems (PEDS)\",\"volume\":\"63 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE 12th International Conference on Power Electronics and Drive Systems (PEDS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PEDS.2017.8289280\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE 12th International Conference on Power Electronics and Drive Systems (PEDS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PEDS.2017.8289280","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12

摘要

在这项工作中,提出了一种基于开关电流镜像拓扑的电流源栅极驱动器,用于绝缘栅双极晶体管(IGBT)。研究了不同栅电流水平对导通和关断事件的影响。实验测量采用双脉冲试验台进行。由此产生的开关轨迹以及开关损耗与使用不同栅极电阻变化的标准推挽驱动级进行比较。实验结果表明,标准推挽型栅极驱动器和电流源型栅极驱动器的开关波形具有相同的性能。此外,在使用两种驱动器拓扑结构的相同过压峰值和过流峰值时,发现了相等的开关损耗。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Experimental comparison of voltage and current source gate drivers for IGBTs
In this work, a current source gate driver based on a switched current mirror topology for an insulated-gate bipolar transistor (IGBT) is presented. The influence of different gate current levels for the turn-on and turn-off events is investigated. Experimental measurements are conducted using a double pulse test bench. The resulting switching trajectories as well as switching losses are compared to a standard push-pull driver stage using a variation of different gate resistors. It is found that the measured switching waveforms of the standard push-pull gate driver and the current source gate driver show equal performance. Furthermore, equal switching losses are found for equal overvoltage peaks and overcurrent peaks using both driver topologies.
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