{"title":"一种新型MCM-DL技术的热力学建模","authors":"R. Dunne, S. Sitaraman","doi":"10.1109/ECTC.1996.550502","DOIUrl":null,"url":null,"abstract":"This paper presents parametric studies to assess the thermomechanical reliability of a novel \"sandwich\" substrate with integrated passives under thermal shock testing. A thermoelastic-plastic finite element analysis is done where FR4 is treated as elastic and orthotropic (with temperature-dependent material properties), and the dielectric polymer and Copper are treated as bilinear elastic-plastic materials. The effect of some geometric and material parameters-FR4 base layer height and insulating layer material-on board warpage and the thermal stress/strain field is discussed, and design guidelines for improved thermo-mechanical integrity of the substrate are suggested.","PeriodicalId":143519,"journal":{"name":"1996 Proceedings 46th Electronic Components and Technology Conference","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Thermo-mechanical modeling of a novel MCM-DL technology\",\"authors\":\"R. Dunne, S. Sitaraman\",\"doi\":\"10.1109/ECTC.1996.550502\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents parametric studies to assess the thermomechanical reliability of a novel \\\"sandwich\\\" substrate with integrated passives under thermal shock testing. A thermoelastic-plastic finite element analysis is done where FR4 is treated as elastic and orthotropic (with temperature-dependent material properties), and the dielectric polymer and Copper are treated as bilinear elastic-plastic materials. The effect of some geometric and material parameters-FR4 base layer height and insulating layer material-on board warpage and the thermal stress/strain field is discussed, and design guidelines for improved thermo-mechanical integrity of the substrate are suggested.\",\"PeriodicalId\":143519,\"journal\":{\"name\":\"1996 Proceedings 46th Electronic Components and Technology Conference\",\"volume\":\"46 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-05-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1996 Proceedings 46th Electronic Components and Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.1996.550502\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 Proceedings 46th Electronic Components and Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1996.550502","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Thermo-mechanical modeling of a novel MCM-DL technology
This paper presents parametric studies to assess the thermomechanical reliability of a novel "sandwich" substrate with integrated passives under thermal shock testing. A thermoelastic-plastic finite element analysis is done where FR4 is treated as elastic and orthotropic (with temperature-dependent material properties), and the dielectric polymer and Copper are treated as bilinear elastic-plastic materials. The effect of some geometric and material parameters-FR4 base layer height and insulating layer material-on board warpage and the thermal stress/strain field is discussed, and design guidelines for improved thermo-mechanical integrity of the substrate are suggested.