低于0.13/spl亩/宽的动态门的条件看守技术

2001 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.01CH37185) Pub Date : 2001-06-14 DOI:10.1109/VLSIC.2001.934184

A. Alvandpour, R. Krishnamurthy, K. Soumyanath, S. Borkar

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引用次数: 42

摘要

泄漏电流的增大严重限制了宽动态门的鲁棒性。我们提出了一种高效的、有条件的看守技术，只有当动态输出在评估阶段保持高时，看守的大部分才被打开。因此，强守门员可以与漏门一起使用，而不会对门的性能产生重大影响。与传统技术相比，在0.13 /spl mu/m的技术中，8到32位宽动态门的性能提高了9到35%。

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A conditional keeper technique for sub-0.13/spl mu/ wide dynamic gates

Increasing leakage currents seriously limits the robustness of wide dynamic gates. We present an efficient, conditional keeper technique, where a large fraction of the keeper is turned ON only if the dynamic output remains high in the evaluation phase. Thus, strong keepers can be utilized with leaky gates without significant impact on performance of the gates. Compared to the conventional technique, 9-to-35% higher performances have been observed across 8-to-32-bit wide dynamic gates in a 0.13 /spl mu/m technology.

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2001 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.01CH37185)

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