M. Yoshinori, T. Yanagitani, M. Matsukawa, Y. Watanabe
{"title":"利用(1120)织构zno薄膜极化反转层的高阶剪切模式FBAR","authors":"M. Yoshinori, T. Yanagitani, M. Matsukawa, Y. Watanabe","doi":"10.1109/ULTSYM.2005.1603224","DOIUrl":null,"url":null,"abstract":"Second-order shear mode FBAR using (1120) textured ZnO film was fabricated. This FBAR contained two ZnO layers with opposite polarizations. Crystallites growth directions of the ZnO layers were clarified by X-ray pole figure analysis. Characteristics of this FBAR were experimentally and theoretically investigated. Keywords-component; Shear mode; Higher order mode FBAR; (1120) textured Zinc Oxide; Polarization-inverted piezoelectric layers","PeriodicalId":302030,"journal":{"name":"IEEE Ultrasonics Symposium, 2005.","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Higher-order shear mode FBAR using polarization-inverted layers of (1120) textured zno films\",\"authors\":\"M. Yoshinori, T. Yanagitani, M. Matsukawa, Y. Watanabe\",\"doi\":\"10.1109/ULTSYM.2005.1603224\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Second-order shear mode FBAR using (1120) textured ZnO film was fabricated. This FBAR contained two ZnO layers with opposite polarizations. Crystallites growth directions of the ZnO layers were clarified by X-ray pole figure analysis. Characteristics of this FBAR were experimentally and theoretically investigated. Keywords-component; Shear mode; Higher order mode FBAR; (1120) textured Zinc Oxide; Polarization-inverted piezoelectric layers\",\"PeriodicalId\":302030,\"journal\":{\"name\":\"IEEE Ultrasonics Symposium, 2005.\",\"volume\":\"25 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Ultrasonics Symposium, 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ULTSYM.2005.1603224\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Ultrasonics Symposium, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ULTSYM.2005.1603224","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Higher-order shear mode FBAR using polarization-inverted layers of (1120) textured zno films
Second-order shear mode FBAR using (1120) textured ZnO film was fabricated. This FBAR contained two ZnO layers with opposite polarizations. Crystallites growth directions of the ZnO layers were clarified by X-ray pole figure analysis. Characteristics of this FBAR were experimentally and theoretically investigated. Keywords-component; Shear mode; Higher order mode FBAR; (1120) textured Zinc Oxide; Polarization-inverted piezoelectric layers