How (In)adequate is one-time testing

Peter Ehlig Texas Instruments, Inc. Stafford, Texas (pehlig@ti.com) I am often introduced as an expert in how integrated circuits work. This is not all tha; accurate. My field of expertise is in how integrated circuits fail and more specifically how they fail in end systems. I find this perspective biases my positions in a different direction from many experts in the fields of silicon test or silicon qualification. also cause issues. These noise events may come from localized current starvation or bus switching. The potential for noise events in the final system is nearly impossible to accurately model in a device design or production test environment. These events, coupled with subtle defects that did not fail the device production test, may later cause end system failures.