{"title":"IEEE标准1149.6的首次集成验证","authors":"S. Vandivier, M. Wahl, J. Rearick","doi":"10.1109/TEST.2003.1270890","DOIUrl":null,"url":null,"abstract":"This paper provides proof of concept for the newly-approved 1149.6 standard by investigating the first silicon implementation of the test receiver. EXTEST and EXTEST/spl I.bar/PULSE tests were applied to functional channels as well as channels with a set of externally-induced hard defects. All valid signals were correctly received, and all defects were detected, thus validating both 1149.6's anticipated backwards compatibility with 1149.1 and fault coverage. Mission-mode tests showed no performance degradation due to the test circuits. Characterization across PVT of the test receiver suggests 1149.6's robustness with respect to noise.","PeriodicalId":236182,"journal":{"name":"International Test Conference, 2003. Proceedings. ITC 2003.","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"First ic validation of IEEE Std. 1149.6\",\"authors\":\"S. Vandivier, M. Wahl, J. Rearick\",\"doi\":\"10.1109/TEST.2003.1270890\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper provides proof of concept for the newly-approved 1149.6 standard by investigating the first silicon implementation of the test receiver. EXTEST and EXTEST/spl I.bar/PULSE tests were applied to functional channels as well as channels with a set of externally-induced hard defects. All valid signals were correctly received, and all defects were detected, thus validating both 1149.6's anticipated backwards compatibility with 1149.1 and fault coverage. Mission-mode tests showed no performance degradation due to the test circuits. Characterization across PVT of the test receiver suggests 1149.6's robustness with respect to noise.\",\"PeriodicalId\":236182,\"journal\":{\"name\":\"International Test Conference, 2003. Proceedings. ITC 2003.\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-09-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Test Conference, 2003. Proceedings. ITC 2003.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2003.1270890\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Test Conference, 2003. Proceedings. ITC 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2003.1270890","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper provides proof of concept for the newly-approved 1149.6 standard by investigating the first silicon implementation of the test receiver. EXTEST and EXTEST/spl I.bar/PULSE tests were applied to functional channels as well as channels with a set of externally-induced hard defects. All valid signals were correctly received, and all defects were detected, thus validating both 1149.6's anticipated backwards compatibility with 1149.1 and fault coverage. Mission-mode tests showed no performance degradation due to the test circuits. Characterization across PVT of the test receiver suggests 1149.6's robustness with respect to noise.
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