一个12位50 ms /s 3.3 mw SAR ADC,带有背景数字校准

Wenbo Liu, P. Huang, Y. Chiu
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引用次数: 53

摘要

本文提出了一种基于位相关(BWC)的背景数字校正技术,用于校正连续逼近寄存器(SAR)模数转换器(ADC)中电容式数模转换器(DAC)失配误差。通过向ADC输入注入单比特伪随机噪声(PN),校准引擎同时提取所有比特权重,以方便数字域校正。与此技术相关的模拟开销可以忽略不计,并且转换速度完全保留(与[1]相反,其中ADC吞吐量减半)。一个用90纳米CMOS制造的12bit 50-MS/s SAR ADC原型在校准时测量了66.5 db峰值SNDR和86.0 db峰值SFDR,而在1.2 v电源下占用0.046 mm2,功耗3.3 mW。校准逻辑估计占用0.072 mm2,在相同的过程中功耗为1.4 mW。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A 12-bit 50-MS/s 3.3-mW SAR ADC with background digital calibration
This paper describes a background digital calibration technique based on bitwise correlation (BWC) to correct the capacitive digital-to-analog converter (DAC) mismatch error in successive-approximation-register (SAR) analog-to-digital converters (ADC's). Aided by a single-bit pseudorandom noise (PN) injected to the ADC input, the calibration engine extracts all bit weights simultaneously to facilitate a digital-domain correction. The analog overhead associated with this technique is negligible and the conversion speed is fully retained (in contrast to [1] in which the ADC throughput is halved). A prototype 12bit 50-MS/s SAR ADC fabricated in 90-nm CMOS measured a 66.5-dB peak SNDR and an 86.0-dB peak SFDR with calibration, while occupying 0.046 mm2 and dissipating 3.3 mW from a 1.2-V supply. The calibration logic is estimated to occupy 0.072 mm2 with a power consumption of 1.4 mW in the same process.
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