{"title":"一个12位50 ms /s 3.3 mw SAR ADC,带有背景数字校准","authors":"Wenbo Liu, P. Huang, Y. Chiu","doi":"10.1109/CICC.2012.6330694","DOIUrl":null,"url":null,"abstract":"This paper describes a background digital calibration technique based on bitwise correlation (BWC) to correct the capacitive digital-to-analog converter (DAC) mismatch error in successive-approximation-register (SAR) analog-to-digital converters (ADC's). Aided by a single-bit pseudorandom noise (PN) injected to the ADC input, the calibration engine extracts all bit weights simultaneously to facilitate a digital-domain correction. The analog overhead associated with this technique is negligible and the conversion speed is fully retained (in contrast to [1] in which the ADC throughput is halved). A prototype 12bit 50-MS/s SAR ADC fabricated in 90-nm CMOS measured a 66.5-dB peak SNDR and an 86.0-dB peak SFDR with calibration, while occupying 0.046 mm2 and dissipating 3.3 mW from a 1.2-V supply. The calibration logic is estimated to occupy 0.072 mm2 with a power consumption of 1.4 mW in the same process.","PeriodicalId":130434,"journal":{"name":"Proceedings of the IEEE 2012 Custom Integrated Circuits Conference","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-10-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"53","resultStr":"{\"title\":\"A 12-bit 50-MS/s 3.3-mW SAR ADC with background digital calibration\",\"authors\":\"Wenbo Liu, P. Huang, Y. Chiu\",\"doi\":\"10.1109/CICC.2012.6330694\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a background digital calibration technique based on bitwise correlation (BWC) to correct the capacitive digital-to-analog converter (DAC) mismatch error in successive-approximation-register (SAR) analog-to-digital converters (ADC's). Aided by a single-bit pseudorandom noise (PN) injected to the ADC input, the calibration engine extracts all bit weights simultaneously to facilitate a digital-domain correction. The analog overhead associated with this technique is negligible and the conversion speed is fully retained (in contrast to [1] in which the ADC throughput is halved). A prototype 12bit 50-MS/s SAR ADC fabricated in 90-nm CMOS measured a 66.5-dB peak SNDR and an 86.0-dB peak SFDR with calibration, while occupying 0.046 mm2 and dissipating 3.3 mW from a 1.2-V supply. The calibration logic is estimated to occupy 0.072 mm2 with a power consumption of 1.4 mW in the same process.\",\"PeriodicalId\":130434,\"journal\":{\"name\":\"Proceedings of the IEEE 2012 Custom Integrated Circuits Conference\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-10-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"53\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the IEEE 2012 Custom Integrated Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICC.2012.6330694\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2012 Custom Integrated Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2012.6330694","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 12-bit 50-MS/s 3.3-mW SAR ADC with background digital calibration
This paper describes a background digital calibration technique based on bitwise correlation (BWC) to correct the capacitive digital-to-analog converter (DAC) mismatch error in successive-approximation-register (SAR) analog-to-digital converters (ADC's). Aided by a single-bit pseudorandom noise (PN) injected to the ADC input, the calibration engine extracts all bit weights simultaneously to facilitate a digital-domain correction. The analog overhead associated with this technique is negligible and the conversion speed is fully retained (in contrast to [1] in which the ADC throughput is halved). A prototype 12bit 50-MS/s SAR ADC fabricated in 90-nm CMOS measured a 66.5-dB peak SNDR and an 86.0-dB peak SFDR with calibration, while occupying 0.046 mm2 and dissipating 3.3 mW from a 1.2-V supply. The calibration logic is estimated to occupy 0.072 mm2 with a power consumption of 1.4 mW in the same process.