隐式状态转换图:应用于顺序逻辑的综合和测试

P. Ashar, Abhijit Ghosh, S. Devadas, A. Newton
{"title":"隐式状态转换图:应用于顺序逻辑的综合和测试","authors":"P. Ashar, Abhijit Ghosh, S. Devadas, A. Newton","doi":"10.1109/ICCAD.1990.129847","DOIUrl":null,"url":null,"abstract":"Implicit state enumeration is used in developing strategies to solve key problems in sequential logic synthesis and test. It is shown that it is possible to extract implicit state transition graphs (ISTGs) from logic-gate and flip-flop descriptions of sequential circuits that allow equivalent states to be represented by cubes, and edges from different states to be coalesced into one, thereby decreasing significantly the CPU time and memory requirements of the extraction process. Coupled with the enumeration technique, synthesis strategies are proposed for FSMs (finite state machines) described at the logic level. As is illustrated, these synthesis strategies allow the authors to optimize large FSMs. The authors apply an ISTG traversal algorithm for verifying equivalence and detecting redundancies in logic-level sequential circuits. This algorithm is more efficient than previously developed sequential test generation algorithms when used to detect equivalent-state redundancies present in some classes of circuits.<<ETX>>","PeriodicalId":242666,"journal":{"name":"1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Implicit state transition graphs: applications to sequential logic synthesis and test\",\"authors\":\"P. Ashar, Abhijit Ghosh, S. Devadas, A. Newton\",\"doi\":\"10.1109/ICCAD.1990.129847\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Implicit state enumeration is used in developing strategies to solve key problems in sequential logic synthesis and test. It is shown that it is possible to extract implicit state transition graphs (ISTGs) from logic-gate and flip-flop descriptions of sequential circuits that allow equivalent states to be represented by cubes, and edges from different states to be coalesced into one, thereby decreasing significantly the CPU time and memory requirements of the extraction process. Coupled with the enumeration technique, synthesis strategies are proposed for FSMs (finite state machines) described at the logic level. As is illustrated, these synthesis strategies allow the authors to optimize large FSMs. The authors apply an ISTG traversal algorithm for verifying equivalence and detecting redundancies in logic-level sequential circuits. This algorithm is more efficient than previously developed sequential test generation algorithms when used to detect equivalent-state redundancies present in some classes of circuits.<<ETX>>\",\"PeriodicalId\":242666,\"journal\":{\"name\":\"1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-11-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCAD.1990.129847\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCAD.1990.129847","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10

摘要

隐式状态枚举用于制定策略,解决序列逻辑综合与测试中的关键问题。研究表明,从顺序电路的逻辑门和触发器描述中提取隐式状态转移图(istg)是可能的,它允许用立方体表示等效状态,并将来自不同状态的边合并为一个,从而显着降低了提取过程的CPU时间和内存需求。结合枚举技术,提出了在逻辑层次上描述有限状态机的综合策略。如图所示,这些合成策略允许作者优化大型fsm。作者应用ISTG遍历算法验证等效性和检测冗余在逻辑级顺序电路。当用于检测某些类别电路中存在的等效状态冗余时,该算法比以前开发的顺序测试生成算法更有效。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Implicit state transition graphs: applications to sequential logic synthesis and test
Implicit state enumeration is used in developing strategies to solve key problems in sequential logic synthesis and test. It is shown that it is possible to extract implicit state transition graphs (ISTGs) from logic-gate and flip-flop descriptions of sequential circuits that allow equivalent states to be represented by cubes, and edges from different states to be coalesced into one, thereby decreasing significantly the CPU time and memory requirements of the extraction process. Coupled with the enumeration technique, synthesis strategies are proposed for FSMs (finite state machines) described at the logic level. As is illustrated, these synthesis strategies allow the authors to optimize large FSMs. The authors apply an ISTG traversal algorithm for verifying equivalence and detecting redundancies in logic-level sequential circuits. This algorithm is more efficient than previously developed sequential test generation algorithms when used to detect equivalent-state redundancies present in some classes of circuits.<>
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信