SP&R:亚7nm标准细胞合成的同步放置和路由框架

Dongwon Park, Daeyeal Lee, Ilgweon Kang, Sicun Gao, Bill Lin, Chung-Kuan Cheng
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引用次数: 9

摘要

标准单元合成需要谨慎的工程方法来确保各种数字IC设计的可达性,因为sub-7nm技术节点的物理设计(PD)需要整体努力来解决紧迫和重要的设计挑战。由于复杂的多模式技术,布线轨道的数量越来越少,设计规则也越来越复杂,这使得设计标准小区的布线(P&R)变得非常困难和耗时。已经提出了许多传统的方法来改善晶体管级的P&R和引脚可达性,然而,由于启发式/分而治之的方式,这些方法是不够的。在本文中,我们提出了一个新的框架SP&R,它通过基于动态引脚分配的单元合成,同时解决了设计标准单元布局时的P&R问题,而无需部署任何顺序过程(在位置和路线步骤之间)。SP&R利用可满足性模理论(SMT)的扩展——优化模理论(OMT),利用基于布尔可满足性的快速推理能力获得最优的标准单元布局。通过针对sub-7nm技术节点的实际标准电池设计,我们验证了我们的SP&R框架在金属长度方面比顺序方法平均减少了10.5%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
SP&R: Simultaneous Placement and Routing framework for standard cell synthesis in sub-7nm
Standard cell synthesis requires careful engineering approaches to ensure routability across various digital IC designs since physical design (PD) for sub-7nm technology nodes demands holistic efforts to address urgent and nontrivial design challenges. The smaller number of routing tracks and more complex design rules due to the sophisticated multi-patterning technology make place-and-route (P&R) for designing a standard cell extremely hard and time-consuming. Many conventional approaches have been suggested for improving transistor-level P&R and pin accessibility, nonetheless insufficient because of the heuristic/divide-and-conquer manners.In this paper, we propose a novel framework, SP&R, which simultaneously solves P&R for designing standard cell’s layout without deploying any sequential procedures (between place and route steps) by using dynamic pin allocation-based cell synthesis. The proposed SP&R utilizes the Optimization Modulo Theories (OMT), an extension of the Satisfiability modulo theories (SMT), to obtain optimal standard cell layout by virtue of SAT (Boolean Satisfiability)-based fast reasoning ability. We validate that our SP&R framework achieves 10.5% of reduction on average in terms of metal length compared to the sequential approach, through practical standard cell designs targeting sub-7nm technology nodes.
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