实时微视觉系统的三维集成技术

H. Kurino, T. Matsumoto, K. Yu, N. Miyakawa, H. Itani, H. Tsukamoto, M. Koyanagi
{"title":"实时微视觉系统的三维集成技术","authors":"H. Kurino, T. Matsumoto, K. Yu, N. Miyakawa, H. Itani, H. Tsukamoto, M. Koyanagi","doi":"10.1109/ICISS.1997.630262","DOIUrl":null,"url":null,"abstract":"It becomes possible to achieve the real time micro-vision system with extremely high image processing speed if three-dimensional LSI comes into reality because a higher level of parallel processing can be performed in three-dimensional LSI. Then, we have proposed a new three-dimensional integration technology for such real time micro-vision system with high image processing speed. Several key technologies for three-dimensional integration such as formation of buried interconnection and micro-bump, wafer thinning, wafer alignment and wafer bonding have been developed.","PeriodicalId":357602,"journal":{"name":"1997 Proceedings Second Annual IEEE International Conference on Innovative Systems in Silicon","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"18","resultStr":"{\"title\":\"Three-dimensional integration technology for real time micro-vision system\",\"authors\":\"H. Kurino, T. Matsumoto, K. Yu, N. Miyakawa, H. Itani, H. Tsukamoto, M. Koyanagi\",\"doi\":\"10.1109/ICISS.1997.630262\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"It becomes possible to achieve the real time micro-vision system with extremely high image processing speed if three-dimensional LSI comes into reality because a higher level of parallel processing can be performed in three-dimensional LSI. Then, we have proposed a new three-dimensional integration technology for such real time micro-vision system with high image processing speed. Several key technologies for three-dimensional integration such as formation of buried interconnection and micro-bump, wafer thinning, wafer alignment and wafer bonding have been developed.\",\"PeriodicalId\":357602,\"journal\":{\"name\":\"1997 Proceedings Second Annual IEEE International Conference on Innovative Systems in Silicon\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"18\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1997 Proceedings Second Annual IEEE International Conference on Innovative Systems in Silicon\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICISS.1997.630262\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1997 Proceedings Second Annual IEEE International Conference on Innovative Systems in Silicon","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICISS.1997.630262","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 18

摘要

由于三维大规模集成电路可以进行更高层次的并行处理,使得三维大规模集成电路实现具有极高图像处理速度的实时微视觉系统成为可能。然后,我们提出了一种新的三维集成技术,用于这种具有高图像处理速度的实时微视觉系统。开发了埋藏互连和微凸点形成、晶圆减薄、晶圆对准和晶圆键合等三维集成的关键技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Three-dimensional integration technology for real time micro-vision system
It becomes possible to achieve the real time micro-vision system with extremely high image processing speed if three-dimensional LSI comes into reality because a higher level of parallel processing can be performed in three-dimensional LSI. Then, we have proposed a new three-dimensional integration technology for such real time micro-vision system with high image processing speed. Several key technologies for three-dimensional integration such as formation of buried interconnection and micro-bump, wafer thinning, wafer alignment and wafer bonding have been developed.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信