利用一种新的BEOL信号选择方法提高分离制造的安全性

Suyuan Chen, R. Vemuri
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引用次数: 7

摘要

集成电路(IC)的分裂制造被提议作为一种可能的防御,以防止使用可能不受信任的代工厂所产生的安全问题。然而,分裂制造的设计被证明容易受到一种被称为接近攻击的新形式的攻击,这种攻击试图对BEOL(后端线路)信号进行逆向工程。因此,在识别BEOL信号及其放置和路由时必须小心。在本文中,我们提出了一种安全的BEOL信号选择算法来对抗接近攻击。我们的方法基于两个新特征:首先,我们基于每个信号对输出的影响引入了一个新的信号选择指标。其次,我们使用多路划分算法来找到一个“安全”切割集,它是分配给BEOL层的信号集。我们的方法增加了BEOL网络的数量,同时最大限度地减少了对性能的影响。我们给出的实验结果显示,安全性有了显著提高(平均提高800%),而对性能的影响不大(平均不到4%)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Improving the Security of Split Manufacturing Using a Novel BEOL Signal Selection Method
Split manufacturing of integrated circuits (IC) was proposed as a possible defense against security issues arising from the use of potentially untrusted foundries. However, split manufactured designs were shown to be vulnerable to a new form of attack known as the proximity attack which attempts to reverse engineer the BEOL (Back End of Line) signals. Hence, care must be exercised in identifying the BEOL signals and their placement and routing. In this paper, we present a secure BEOL signal selection algorithm to defeat proximity attacks. Our method is based on two novel features: First, we introduce a new metric for signal selection based on the effect each signal has on the outputs. Second, we use a multiway partitioning algorithm to find a 'secure' cut-set which is the set of signals assigned to the BEOL layers. Our approach increases the number of BEOL nets while minimizing the impact on performance. We present experimental results which show significant improvement in security (on average by 800%) with only a modest effect on performance (less than 4% on average).
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