试验计划的组合方案(以微处理器系统为例)

2008 IEEE Region 8 International Conference on Computational Technologies in Electrical and Electronics Engineering Pub Date : 2008-07-21 DOI:10.1109/SIBIRCON.2008.4602579

Mark Sh. Levin, Alexey O. Merzlyakov

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引用次数: 6

摘要

本文的重点是为一组微处理器系统设计一种有效的测试策略(计划)。这个问题作为一个综合问题来研究。提出了一个四阶段求解方案。使用了以下基本模型:(i)多标准排序，(ii)类似背包的问题(例如，多标准选择题)，(iii)聚类，以及(iv)多标准分配/分配。

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Composite combinatorial scheme of test planning (example for microprocessor systems)

This paper focuses on designing an efficient test strategy (plan) for a set of microprocessor systems. The problem is examined as a composite one. A four-stage solving scheme is suggested. The following underlying models are used: (i) multicriteria ranking, (ii) knapsack-like problems (e.g., multicriteria multiple choice problem), (iii) clustering, and (iv) multicriteria assignment/allocation.

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2008 IEEE Region 8 International Conference on Computational Technologies in Electrical and Electronics Engineering

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