{"title":"基于固态调谐器的2-26.5 GHZ片上噪声和s参数测量","authors":"V. Adamian","doi":"10.1109/ARFTG.1989.323954","DOIUrl":null,"url":null,"abstract":"A new 2-26.5 GHz on wafer noise parameter measurement is presented. A solid state impedance tuner based test set in conjunction with a vector network analyzer (NWA) and a noise figure system (NFS) can determine the noise and S-parameters of the devices.","PeriodicalId":153615,"journal":{"name":"34th ARFTG Conference Digest","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":"{\"title\":\"2-26.5 GHZ On-Wafer Noise and S-Parameter Measurements Using a Solid State Tuner\",\"authors\":\"V. Adamian\",\"doi\":\"10.1109/ARFTG.1989.323954\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new 2-26.5 GHz on wafer noise parameter measurement is presented. A solid state impedance tuner based test set in conjunction with a vector network analyzer (NWA) and a noise figure system (NFS) can determine the noise and S-parameters of the devices.\",\"PeriodicalId\":153615,\"journal\":{\"name\":\"34th ARFTG Conference Digest\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"20\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"34th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.1989.323954\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"34th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1989.323954","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
2-26.5 GHZ On-Wafer Noise and S-Parameter Measurements Using a Solid State Tuner
A new 2-26.5 GHz on wafer noise parameter measurement is presented. A solid state impedance tuner based test set in conjunction with a vector network analyzer (NWA) and a noise figure system (NFS) can determine the noise and S-parameters of the devices.
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