SOI RFIC的非对称源/漏结结构:对浮体效应免疫

R. Yang, J.F. Li, H. Qian, Z. Han
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引用次数: 1

摘要

结合非对称源漏结体接触、SiO/sub 2//Si/sub 3/N/sub 4/双侧壁和Ti-salicide等关键技术,提出了用于RFIC的新型SOI LDMOS/ NMOS/电感/电容/电阻器集成结构。这些器件通过简化的工艺步骤集成到SIMOX基板中。实验和仿真结果表明,LDMOS的浮体效应得到了很好的抑制,直流特性良好,且截止频率高于传统的侧向体接触结构器件。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An asymmetrical source/drain junction structure for SOI RFIC: immune to floating body effects
Novel integration structures of SOI LDMOS/ NMOS/inductor/capacitor/resistor for RFIC are proposed, combined with several key techniques, including body contact with asymmetrical source/drain junctions, SiO/sub 2//Si/sub 3/N/sub 4/ dual sidewalls and Ti-salicide, etc. These devices are integrated into the SIMOX substrate with simplified process steps. Experimental or simulated results show that floating body effects are well restrained, and DC characteristics are good, while the cutoff frequency of LDMOS is higher than that of conventional devices with lateral body-contact structures.
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